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Device Circuit Co-Design Issues in FETs

Device Circuit Co-Design Issues in FETs

Title: Device Circuit Co-Design Issues in FETs
Authors: Shubham Tayal, Billel Smaani, Shiromani Balmukund Rahi
Year: 2024
Publisher: CRC Press
English language
Format: pdf (true)
Pages: 280
Size: 10.1 mb

This book provides an overview of emerging semiconductor devices and their applications in electronic circuits, which form the foundation of electronic devices. The chapters examine the challenges and scope of FinFET device circuits, 3D FETs, and advanced FET for circuit applications. The book also discusses low-power memory design, neuromorphic computing, and issues related to thermal reliability.

The authors provide a good understanding of device physics and circuits, and discuss transistors based on the new channel/dielectric materials and device architectures to achieve low-power dissipation and ultra-high switching speeds to fulfill the requirements of the semiconductor industry.

This book is intended for students, researchers, and professionals in the field of semiconductor devices and nanodevices, as well as those working on device-circuit co-design issues.

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